- Turkish Journal of Physics
- Vol: 24 Issue: 2
- Thickness Dependence of c/a Polytwin Structures Observed in Epitaxial Oxide Ferroelectric Thin Films
Thickness Dependence of c/a Polytwin Structures Observed in Epitaxial Oxide Ferroelectric Thin Films
Authors : S. Pamir Alpay And Alexander L. Roytburd
Pages : 85-92
View : 9 | Download : 6
Publication Date : 9999-12-31
Article Type : Makaleler
Abstract :Ferroelectric or ferroelastic epitaxial films undergoing a cubic-to-tetragonal phase transformation usually relax the resultant strain energy due to lattice misfit by forming a polytwin (polydomain) structure. Polydomain formation occurs at the expense of building interdomain interfaces and microstresses which develop at the film-substrate interface due to the periodic deviation of the strain. The interplay between these components results in a critical thickness for domain formation below which the polydomain structure is not stable. In this article, we investigate the film thickness dependence of a polydomain structure using a thermodynamical approach.Keywords : Turk. J. Phys., 24, (2000), 85-92. Full text: pdf Other articles published in the same issue: Turk. J. Phys., vol.24, iss.2.