- Turkish Journal of Physics
- Vol: 25 Issue: 4
- Computational Study for the Structural Change of the System CdTe1-x Sx Thin Film
Computational Study for the Structural Change of the System CdTe1-x Sx Thin Film
Authors : Emad Khdayer Al-shakarchi
Pages : 355-362
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Publication Date : 9999-12-31
Article Type : Makaleler
Abstract :Polycrystalline thin film of the graded system CdTe1-xSx for x=0,0.1,\ldots,1 are prepared by using thermal evaporation technique deposited on the glass substrate with an average thickness 3000 Å for each individual value of x . XRD technique is used with the aid of a computational program to study the phase change from cubic zinc blend structure to hexagonal wurtzite with an inversion point related to the x-value. It is found that x=0.1 gives us an inversion point in the structural change from cubic to hexagonal phase.Keywords : Thin films, ternary compound, structural behaviour and miller indices