Electron Spectroscopy for Material Characterization
Authors : Şefik Süzer
Pages : 309-320
View : 7 | Download : 5
Publication Date : 9999-12-31
Article Type : Makaleler
Abstract :Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characterization are introduced through examples with application of these techniques to various surface related problems.Keywords : Turk. J. Chem., 22, (1998), 309-320. Full text: pdf Other articles published in the same issue: Turk. J. Chem., vol.22, iss.4.