Fingerprinting the Malfunction of Devices
Authors : Yehia EL-SAYED
Pages : 79-85
View : 6 | Download : 3
Publication Date : 2007-06-01
Article Type : Other
Abstract :A methodology to generate fingerprints for malfunctioning devices in a system from the design information of the system is proposed. The aim is to reduce measurement to the minimum and to the simple at the expense of more computation. A simple combined cycle is considered. A baseline of fingerprints is generated by considering the degradation of one of the efficiency parameters of a single device; one degradation at a time. Different degrees of degradation are considered at different load fractions. The load fractions considered cover the range from 1 (design point) to 0.4. The degrees of degradation considered cover the range from 1 (no degradation) to 0.6, the efficiency occurring at the considered load fraction. The needed design information is stated. Examples of fingerprints are presented in tables. Application of the base-line fingerprint methodology to existing plants in general is described. Extension to multi-degraded efficiency parameters is considered guided by the baseline fingerprints.Keywords : off-design performance of a device, device efficiency degradation, device malfunction fingerprints